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Advanced Transmission Electron Microscopy

Overview of attention for book
Attention for Chapter 1: Aberration-Corrected Electron Microscopy of Nanoparticles
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Chapter title
Aberration-Corrected Electron Microscopy of Nanoparticles
Chapter number 1
Book title
Advanced Transmission Electron Microscopy
Published by
Springer, Cham, January 2015
DOI 10.1007/978-3-319-15177-9_1
Book ISBNs
978-3-31-915176-2, 978-3-31-915177-9
Authors

Miguel José Yacamán, Ulises Santiago, Sergio Mejía-Rosales, Yacamán, Miguel José, Santiago, Ulises, Mejía-Rosales, Sergio

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 14 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 14 100%

Demographic breakdown

Readers by professional status Count As %
Professor 4 29%
Student > Ph. D. Student 3 21%
Researcher 1 7%
Student > Postgraduate 1 7%
Unknown 5 36%
Readers by discipline Count As %
Materials Science 4 29%
Physics and Astronomy 1 7%
Biochemistry, Genetics and Molecular Biology 1 7%
Chemistry 1 7%
Engineering 1 7%
Other 0 0%
Unknown 6 43%