You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Title |
Scanning Electron Microscopy and X-Ray Microanalysis
|
---|---|
Published by |
Springer US, December 2012
|
DOI | 10.1007/978-1-4613-0491-3 |
ISBNs |
978-1-4612-7653-1, 978-1-4613-0491-3
|
Authors |
Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Romig, A. D., Lyman, Charles E., Fiori, Charles, Lifshin, Eric |