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Fundamentals of III-V Semiconductor MOSFETs

Overview of attention for book
Attention for Chapter 11: Electrical and Material Characteristics of Hafnium Oxide with Silicon Interface Passivation on III-V Substrate for Future Scaled CMOS Technology
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Chapter title
Electrical and Material Characteristics of Hafnium Oxide with Silicon Interface Passivation on III-V Substrate for Future Scaled CMOS Technology
Chapter number 11
Book title
Fundamentals of III-V Semiconductor MOSFETs
Published by
Springer, Boston, MA, January 2010
DOI 10.1007/978-1-4419-1547-4_11
Book ISBNs
978-1-4419-1546-7, 978-1-4419-1547-4
Authors

Injo Ok, Jack C. Lee

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 10 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 10 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 5 50%
Researcher 4 40%
Student > Master 1 10%
Readers by discipline Count As %
Materials Science 4 40%
Engineering 4 40%
Chemistry 1 10%
Physics and Astronomy 1 10%