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Chapter title |
Measurement of Semiconductor Transport Properties Using Scanned Modulated Reflectance
|
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Chapter number | 154 |
Book title |
Review of Progress in Quantitative Nondestructive Evaluation
|
Published by |
Springer, Boston, MA, January 1987
|
DOI | 10.1007/978-1-4613-1893-4_154 |
Book ISBNs |
978-1-4612-9054-4, 978-1-4613-1893-4
|
Authors |
F. Alan McDonald, D. Guidotti, T. M. DelGiudice, McDonald, F. Alan, Guidotti, D., DelGiudice, T. M. |