↓ Skip to main content

Soft Errors in Modern Electronic Systems

Overview of attention for book
Attention for Chapter 7: Integrated Circuit Qualification for Space and Ground-Level Applications: Accelerated Tests and Error-Rate Predictions
Altmetric Badge

Readers on

mendeley
2 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Integrated Circuit Qualification for Space and Ground-Level Applications: Accelerated Tests and Error-Rate Predictions
Chapter number 7
Book title
Soft Errors in Modern Electronic Systems
Published by
Springer, Boston, MA, January 2011
DOI 10.1007/978-1-4419-6993-4_7
Book ISBNs
978-1-4419-6992-7, 978-1-4419-6993-4
Authors

Raoul Velazco, Gilles Foucard, Paul Peronnard

Timeline

Login to access the full chart related to this output.

If you don’t have an account, click here to discover Explorer

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 2 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 3 150%
Readers by discipline Count As %
Engineering 2 100%
Physics and Astronomy 1 50%