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Mendeley readers
| Chapter title |
Wafer Inspection
|
|---|---|
| Chapter number | 7 |
| Book title |
Computer Vision for Electronics Manufacturing
|
| Published by |
Springer, Boston, MA, January 1990
|
| DOI | 10.1007/978-1-4613-0507-1_7 |
| Book ISBNs |
978-1-4612-7841-2, 978-1-4613-0507-1
|
| Authors |
L. F. Pau, Pau, L. F. |
Mendeley readers
The data shown below were compiled from readership statistics for 4 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 4 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Researcher | 2 | 50% |
| Student > Ph. D. Student | 1 | 25% |
| Student > Postgraduate | 1 | 25% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 2 | 50% |
| Computer Science | 1 | 25% |
| Mathematics | 1 | 25% |