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Electrical Characterization of Silicon-on-Insulator Materials and Devices

Overview of attention for book
Attention for Chapter 9: Transistor-Based Characterization Techniques
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Citations

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2 Mendeley
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Chapter title
Transistor-Based Characterization Techniques
Chapter number 9
Book title
Electrical Characterization of Silicon-on-Insulator Materials and Devices
Published by
Springer, Boston, MA, January 1995
DOI 10.1007/978-1-4615-2245-4_9
Book ISBNs
978-0-7923-9548-5, 978-1-4615-2245-4
Authors

Sorin Cristoloveanu, Sheng S. Li

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 2 100%

Demographic breakdown

Readers by professional status Count As %
Professor > Associate Professor 1 50%
Unknown 1 50%
Readers by discipline Count As %
Materials Science 1 50%
Unknown 1 50%