You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
Quality Assessment Model for Critical Manufacturing Process of Crystal Oscillator
|
---|---|
Chapter number | 66 |
Book title |
Recent Trends in Applied Artificial Intelligence
|
Published by |
Springer, Berlin, Heidelberg, June 2013
|
DOI | 10.1007/978-3-642-38577-3_66 |
Book ISBNs |
978-3-64-238576-6, 978-3-64-238577-3
|
Authors |
Kuen-Suan Chen, Ching-Hsin Wang, Yun-Tsan Lin, Chun-Min Yu, Hui-Min Shih, Chen, Kuen-Suan, Wang, Ching-Hsin, Lin, Yun-Tsan, Yu, Chun-Min, Shih, Hui-Min |