↓ Skip to main content
What is this page? Embed badge

Oxide Materials at the Two-Dimensional Limit

Overview of attention for book
Cover of 'Oxide Materials at the Two-Dimensional Limit'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Structure Concepts in Two-Dimensional Oxide Materials
  3. Altmetric Badge
    Chapter 2 Atomistic and Electronic Structure Methods for Nanostructured Oxide Interfaces
  4. Altmetric Badge
    Chapter 3 Role of Structural Flexibility on the Physical and Chemical Properties of Metal-Supported Oxide Ultrathin Films
  5. Altmetric Badge
    Chapter 4 Reducible Oxides as Ultrathin Epitaxial Films
  6. Altmetric Badge
    Chapter 5 Ultrathin Oxide Films on Au(111) Substrates
  7. Altmetric Badge
    Chapter 6 Phonons in Thin Oxide Films
  8. Altmetric Badge
    Chapter 7 Electrostatics and Polarity in 2D Oxides
  9. Altmetric Badge
    Chapter 8 CeO x (111)/Cu(111) Thin Films as Model Catalyst Supports
  10. Altmetric Badge
    Chapter 9 Catalytic Chemistry on Oxide Nanostructures
  11. Altmetric Badge
    Chapter 10 Charge Transfer Processes on Ultrathin Oxide Films
  12. Altmetric Badge
    Chapter 11 Characterizing Defects Responsible for Charge Transport Characteristics at Interfaces of Nano-Thick Materials Stacks
  13. Altmetric Badge
    Chapter 12 Two-Dimensional Electron Gas at Oxide Interfaces
  14. Altmetric Badge
    Chapter 13 Ultrathin Perovskites: From Bulk Structures to New Interface Concepts
Attention for Chapter 10: Charge Transfer Processes on Ultrathin Oxide Films
Altmetric Badge

Citations

dimensions_citation
37 Dimensions
Summary Dimensions citations
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Charge Transfer Processes on Ultrathin Oxide Films
Chapter number 10
Book title
Oxide Materials at the Two-Dimensional Limit
Published in
ADS, January 2016
DOI 10.1007/978-3-319-28332-6_10
Book ISBNs
978-3-31-928330-2, 978-3-31-928332-6
Authors

Thomas Risse

View on publisher site

This page is provided by Altmetric.