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Advanced Microscopy in Mycology

Overview of attention for book
Attention for Chapter 6: In Situ Nanocharacterization of Yeast Cells Using ESEM and FIB
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Chapter title
In Situ Nanocharacterization of Yeast Cells Using ESEM and FIB
Chapter number 6
Book title
Advanced Microscopy in Mycology
Published by
Springer, Cham, January 2015
DOI 10.1007/978-3-319-22437-4_6
Book ISBNs
978-3-31-922436-7, 978-3-31-922437-4
Authors

Yajing Shen, Shen, Yajing

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 1 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 1 100%
Readers by discipline Count As %
Design 1 100%