You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
New Method for Determining Reliability Demonstration Test Plan with Exponential Subsystem Data
|
---|---|
Chapter number | 25 |
Book title |
Proceedings of the 6th International Asia Conference on Industrial Engineering and Management Innovation
|
Published by |
Atlantis Press, Paris, January 2016
|
DOI | 10.2991/978-94-6239-148-2_25 |
Book ISBNs |
978-9-46-239147-5, 978-9-46-239148-2
|
Authors |
Lei Lu, Jiang-pin Yang, Min Wang, Zhi-fang Zuo, Lu, Lei, Yang, Jiang-pin, Wang, Min, Zuo, Zhi-fang |