You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
Applications of Scanning Probe Microscopy in Materiias Science: Examples of Surface Modification and Quantitative Analysis
|
---|---|
Chapter number | 2 |
Book title |
Atomic Force Microscopy/Scanning Tunneling Microscopy 3
|
Published by |
Springer, Boston, MA, January 2002
|
DOI | 10.1007/0-306-47095-0_2 |
Book ISBNs |
978-0-306-46297-9, 978-0-306-47095-0
|
Authors |
Peter von Blanckenhagen |