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Accelerating Test, Validation and Debug of High Speed Serial Interfaces

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Attention for Chapter 3: Accelerating Receiver Jitter Tolerance Testing on ATE
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Chapter title
Accelerating Receiver Jitter Tolerance Testing on ATE
Chapter number 3
Book title
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Published by
Springer, Dordrecht, January 2011
DOI 10.1007/978-90-481-9398-1_3
Book ISBNs
978-9-04-819397-4, 978-9-04-819398-1
Authors

Yongquan Fan, Zeljko Zilic, Fan, Yongquan, Zilic, Zeljko