↓ Skip to main content
What is this page? Embed badge

Control Systems Design

Overview of attention for book
Cover of 'Control Systems Design'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Foundation of Control Systems Design
  3. Altmetric Badge
    Chapter 2 Matching Conditions for Transient Inputs
  4. Altmetric Badge
    Chapter 3 Matching to Environment Generating Persistent Disturbances
  5. Altmetric Badge
    Chapter 4 LMI-based Design
  6. Altmetric Badge
    Chapter 5 Design of a Sampled-data Control System
  7. Altmetric Badge
    Chapter 6 A Numerical Evaluation of the Node Array Method
  8. Altmetric Badge
    Chapter 7 A Simulated Annealing Inequalities Solver
  9. Altmetric Badge
    Chapter 8 Multi-objective Genetic Algorithms for the Method of Inequalities
  10. Altmetric Badge
    Chapter 9 Design of Multivariable Industrial Control Systems by the Method of Inequalities
  11. Altmetric Badge
    Chapter 10 Multi-objective Control using the Principle of Inequalities
  12. Altmetric Badge
    Chapter 11 A MoI Based on ℌ ∞ Theory — with a Case Study
  13. Altmetric Badge
    Chapter 12 Critical Control of the Suspension for a Maglev Transport System
  14. Altmetric Badge
    Chapter 13 Critical Control of Building under Seismic Disturbance
  15. Altmetric Badge
    Chapter 14 Design of a Hard Disk Drive System
  16. Altmetric Badge
    Chapter 15 Two Studies of Robust Matching
Attention for Chapter 9: Design of Multivariable Industrial Control Systems by the Method of Inequalities
Altmetric Badge

Citations

dimensions_citation
46 Dimensions

Readers on

mendeley
1 Mendeley
Summary Dimensions citations
So far, Dimensions has found 46 publications that cite this research output.

46

The most recent citing publications are shown below. View all 46 publications that cite this research output on Dimensions.

This page shows the most recent citations of this research output.

Click here to find out how to access more activity.

This page is provided by Altmetric.