Defects in SiO 2 and Related Dielectrics: Science and Technology
Springer Netherlands
Title |
Defects in SiO 2 and Related Dielectrics: Science and Technology
|
---|---|
Published by |
Springer Netherlands, December 2012
|
DOI | 10.1007/978-94-010-0944-7 |
ISBNs |
978-0-7923-6686-7, 978-9-40-100944-7
|
Editors |
Pacchioni, G., Skuja, L., Griscom, D. L. |
Country | Count | As % |
---|---|---|
France | 1 | 1% |
United Kingdom | 1 | 1% |
Canada | 1 | 1% |
Belgium | 1 | 1% |
Russia | 1 | 1% |
Unknown | 79 | 94% |
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 30 | 36% |
Student > Master | 13 | 15% |
Researcher | 7 | 8% |
Professor > Associate Professor | 4 | 5% |
Student > Bachelor | 3 | 4% |
Other | 13 | 15% |
Unknown | 14 | 17% |
Readers by discipline | Count | As % |
---|---|---|
Physics and Astronomy | 20 | 24% |
Materials Science | 17 | 20% |
Engineering | 10 | 12% |
Chemistry | 8 | 10% |
Chemical Engineering | 4 | 5% |
Other | 8 | 10% |
Unknown | 17 | 20% |