Power-Aware Testing and Test Strategies for Low Power Devices

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Cover of 'Power-Aware Testing and Test Strategies for Low Power Devices'

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Attention for Chapter 11: EDA Solution for Power-Aware Design-for-Test

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A Survey and Recent Advances: Machine Intelligence in Electronic Testing

Article in Journal of Electronic Testing (April 2024)

Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling

Conference proceeding (December 2023)

Advanced Characterization and Testing Techniques

Book chapter (November 2023)

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