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Mendeley readers
Chapter title |
E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods
|
---|---|
Chapter number | 6 |
Book title |
Computer Aided Verification
|
Published by |
Springer, Cham, July 2017
|
DOI | 10.1007/978-3-319-63390-9_6 |
Book ISBNs |
978-3-31-963389-3, 978-3-31-963390-9
|
Authors |
Eshan Singh, Clark Barrett, Subhasish Mitra, Singh, Eshan, Barrett, Clark, Mitra, Subhasish |
Mendeley readers
The data shown below were compiled from readership statistics for 8 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 8 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 2 | 25% |
Student > Doctoral Student | 1 | 13% |
Student > Bachelor | 1 | 13% |
Student > Master | 1 | 13% |
Researcher | 1 | 13% |
Other | 1 | 13% |
Unknown | 1 | 13% |
Readers by discipline | Count | As % |
---|---|---|
Computer Science | 4 | 50% |
Engineering | 3 | 38% |
Unknown | 1 | 13% |