Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures
Article in Journal of Electronic Testing (February 2020)
The most recent citing publications are shown below. View all 3 publications that cite this research output on Dimensions.
Development of a Measurement System-on-Chip and Simulation on FPGA
Conference proceeding (January 2020)
Development of a High-Speed Multi-Target Measurement System-on-Chip
Conference proceeding (January 2019)