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Data Modeling for Metrology and Testing in Measurement Science

Overview of attention for book
Attention for Chapter 3: Three Statistical Paradigms for the Assessment and Interpretation of Measurement Uncertainty
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Citations

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3 Mendeley
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Chapter title
Three Statistical Paradigms for the Assessment and Interpretation of Measurement Uncertainty
Chapter number 3
Book title
Data Modeling for Metrology and Testing in Measurement Science
Published by
Birkhäuser Boston, January 2009
DOI 10.1007/978-0-8176-4804-6_3
Book ISBNs
978-0-8176-4592-2, 978-0-8176-4804-6
Authors

William F. Guthrie, Hung-kung Liu, Andrew L. Rukhin, Blaza Toman, Jack C. M. Wang, Nien-fan Zhang, Guthrie, William F., Liu, Hung-kung, Rukhin, Andrew L., Toman, Blaza, Wang, Jack C. M., Zhang, Nien-fan

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 3 100%

Demographic breakdown

Readers by professional status Count As %
Professor > Associate Professor 1 33%
Student > Doctoral Student 1 33%
Unknown 1 33%
Readers by discipline Count As %
Business, Management and Accounting 1 33%
Engineering 1 33%
Unknown 1 33%