You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
In Situ and Ex Situ Examination of Passivating Cu 2 O Layers with Exafs and Reflexafs
|
---|---|
Chapter number | 17 |
Book title |
Synchrotron Techniques in Interfacial Electrochemistry
|
Published by |
Springer, Dordrecht, January 1994
|
DOI | 10.1007/978-94-017-3200-0_17 |
Book ISBNs |
978-9-04-814406-8, 978-9-40-173200-0
|
Authors |
H.-H. Strehblow, P. Borthen, P. Druska |