The Benefits of AFM in Clean Technology
Azocleantech.com,
Elizaveta Galitckaia / Shutterstock The atomic force microscope was created back in 1986 by the Nobel Prize Winner Gerd Binnig…
Applied Scanning Probe Methods XIII
Overview of attention for book
Table of Contents
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Altmetric BadgeBook Overview
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Altmetric BadgeChapter 1 Visualization of Epicuticular Grease on the Covering Wings in the Colorado Potato Beetle: A Scanning Probe Approach
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Altmetric BadgeChapter 2 A Review on the Structure and Mechanical Properties of Mollusk Shells – Perspectives on Synthetic Biomimetic Materials
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Altmetric BadgeChapter 3 Electro-Oxidative Lithography and Self-Assembly Concepts for Bottom-Up Nanofabrication
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Altmetric BadgeChapter 4 Application of SPM and Related Techniques to the Mechanical Properties of Biotool Materials
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Altmetric BadgeChapter 5 Nanomechanics and Microfluidics as a Tool for Unraveling Blood Clotting Disease
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Altmetric BadgeChapter 6 Atomic Force Microscopic Study of Piezoelectric Polymers
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Altmetric BadgeChapter 7 Quantitative Analysis of Surface Morphology and Applications
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Altmetric BadgeChapter 8 Nanotribological Characterization of Carbonaceous Materials: Study of Diamond Coatings and Graphite
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Altmetric BadgeChapter 9 Atomic Force Microscopy Studies of Aging Mechanisms in Lithium-Ion Batteries
Attention for Chapter 9:
Atomic Force Microscopy Studies of Aging Mechanisms in Lithium-Ion Batteries
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In the top 25% of all research outputs scored by Altmetric
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High Attention Score compared to outputs of the same age (85th percentile)
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High Attention Score compared to outputs of the same age and source (84th percentile)
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