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Roadmap of Scanning Probe Microscopy

Overview of attention for book
Attention for Chapter 19: Evaluation of SPM for LSI Devices
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Chapter title
Evaluation of SPM for LSI Devices
Chapter number 19
Book title
Roadmap of Scanning Probe Microscopy
Published by
Springer, Berlin, Heidelberg, January 2007
DOI 10.1007/978-3-540-34315-8_19
Book ISBNs
978-3-54-034314-1, 978-3-54-034315-8
Authors

Koji Usuda, Takashi Furukawa, Yasushi Kadota, Usuda, Koji, Furukawa, Takashi, Kadota, Yasushi

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 9 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
France 1 11%
Unknown 8 89%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 2 22%
Student > Bachelor 1 11%
Professor 1 11%
Student > Master 1 11%
Researcher 1 11%
Other 2 22%
Unknown 1 11%
Readers by discipline Count As %
Chemistry 2 22%
Engineering 2 22%
Materials Science 2 22%
Psychology 1 11%
Agricultural and Biological Sciences 1 11%
Other 0 0%
Unknown 1 11%