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Mendeley readers
Chapter title |
Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics
|
---|---|
Chapter number | 23 |
Book title |
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
|
Published by |
Springer, Berlin, Heidelberg, January 2011
|
DOI | 10.1007/978-3-642-10497-8_23 |
Book ISBNs |
978-3-64-210496-1, 978-3-64-210497-8
|
Authors |
Christian Teichert, Igor Beinik, Teichert, Christian, Beinik, Igor |
Mendeley readers
The data shown below were compiled from readership statistics for 36 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
United States | 1 | 3% |
Australia | 1 | 3% |
Unknown | 34 | 94% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 12 | 33% |
Student > Master | 5 | 14% |
Researcher | 4 | 11% |
Student > Bachelor | 3 | 8% |
Professor > Associate Professor | 3 | 8% |
Other | 7 | 19% |
Unknown | 2 | 6% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 12 | 33% |
Physics and Astronomy | 11 | 31% |
Engineering | 4 | 11% |
Chemistry | 4 | 11% |
Energy | 1 | 3% |
Other | 0 | 0% |
Unknown | 4 | 11% |