A Brief Review of Single-Event Burnout Failure Mechanisms and Design Tolerances of Silicon Carbide Power MOSFETs
Article in Electronics (April 2024)
The most recent citing publications are shown below. View all 14 publications that cite this research output on Dimensions.
Article in Electronics (April 2024)
Article in Scientific Reports (August 2023)
Article in International Journal of Nanoscience (August 2022)