↓ Skip to main content
What is this page? Embed badge

Dependence in Probability and Statistics

Overview of attention for book
Cover of 'Dependence in Probability and Statistics'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Permutation and bootstrap statistics under infinite variance
  3. Altmetric Badge
    Chapter 2 Max–Stable Processes: Representations, Ergodic Properties and Statistical Applications
  4. Altmetric Badge
    Chapter 3 Best attainable rates of convergence for the estimation of the memory parameter
  5. Altmetric Badge
    Chapter 4 Harmonic analysis tools for statistical inference in the spectral domain
  6. Altmetric Badge
    Chapter 5 On the impact of the number of vanishing moments on the dependence structures of compound Poisson motion and fractional Brownian motion in multifractal time
  7. Altmetric Badge
    Chapter 6 Multifractal scenarios for products of geometric Ornstein-Uhlenbeck type processes
  8. Altmetric Badge
    Chapter 7 A new look at measuring dependence
  9. Altmetric Badge
    Chapter 8 Robust regression with infinite moving average errors
  10. Altmetric Badge
    Chapter 9 A note on the monitoring of changes in linear models with dependent errors
  11. Altmetric Badge
    Chapter 10 Testing for homogeneity of variance in the wavelet domain.
Attention for Chapter 6: Multifractal scenarios for products of geometric Ornstein-Uhlenbeck type processes
Altmetric Badge

Citations

dimensions_citation
5 Dimensions
Summary Dimensions citations
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Multifractal scenarios for products of geometric Ornstein-Uhlenbeck type processes
Chapter number 6
Book title
Dependence in Probability and Statistics
Published by
Springer, Berlin, Heidelberg, January 2010
DOI 10.1007/978-3-642-14104-1_6
Book ISBNs
978-3-64-214103-4, 978-3-64-214104-1
Authors

Vo V. Anh, Nikolai N. Leonenko, Narn-Rueih Shieh

View on publisher site

This page is provided by Altmetric.