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Mendeley readers
| Chapter title |
Structural Characterisation of Quantum Dots by X-Ray Diffraction and TEM
|
|---|---|
| Chapter number | 5 |
| Book title |
Semiconductor Nanostructures
|
| Published by |
Springer, Berlin, Heidelberg, January 2008
|
| DOI | 10.1007/978-3-540-77899-8_5 |
| Book ISBNs |
978-3-54-077898-1, 978-3-54-077899-8
|
| Authors |
R. Köhler, W. Neumann, M. Schmidbauer, M. Hanke, D. Grigoriev, P. Schäfer, H. Kirmse, I. Häusler, R. Schneider |
Mendeley readers
The data shown below were compiled from readership statistics for 29 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| China | 1 | 3% |
| Germany | 1 | 3% |
| Unknown | 27 | 93% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 9 | 31% |
| Professor > Associate Professor | 4 | 14% |
| Student > Bachelor | 4 | 14% |
| Researcher | 4 | 14% |
| Student > Doctoral Student | 2 | 7% |
| Other | 1 | 3% |
| Unknown | 5 | 17% |
| Readers by discipline | Count | As % |
|---|---|---|
| Physics and Astronomy | 10 | 34% |
| Engineering | 5 | 17% |
| Chemistry | 4 | 14% |
| Materials Science | 4 | 14% |
| Unknown | 6 | 21% |