You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
Flaw Identification in ALOK Imaging Systems
|
---|---|
Chapter number | 24 |
Book title |
Proceedings of the Fifteenth International Symposium, July 14–6, 1986
|
Published by |
Springer, Boston, MA, January 1987
|
DOI | 10.1007/978-1-4684-5320-1_24 |
Book ISBNs |
978-1-4684-5322-5, 978-1-4684-5320-1
|
Authors |
Yu Wei, Xing-quen Zhao |