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Scanning Electron Microscopy and X-ray Microanalysis

Overview of attention for book
Attention for Chapter 10: Special Topics in Electron Beam X-Ray Microanalysis
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Citations

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Chapter title
Special Topics in Electron Beam X-Ray Microanalysis
Chapter number 10
Book title
Scanning Electron Microscopy and X-ray Microanalysis
Published by
Springer, Boston, MA, January 2003
DOI 10.1007/978-1-4615-0215-9_10
Book ISBNs
978-1-4613-4969-3, 978-1-4615-0215-9
Authors

Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 54 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
India 1 2%
Germany 1 2%
Unknown 52 96%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 15 28%
Student > Master 11 20%
Researcher 6 11%
Student > Postgraduate 3 6%
Student > Bachelor 2 4%
Other 5 9%
Unknown 12 22%
Readers by discipline Count As %
Materials Science 13 24%
Engineering 7 13%
Chemistry 5 9%
Physics and Astronomy 4 7%
Chemical Engineering 4 7%
Other 3 6%
Unknown 18 33%