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Mendeley readers
Chapter title |
Gate-Level-Accurate Fault-Effect Analysis at Virtual-Prototype Speed
|
---|---|
Chapter number | 12 |
Book title |
Computer Safety, Reliability, and Security
|
Published by |
Springer, Cham, September 2016
|
DOI | 10.1007/978-3-319-45480-1_12 |
Book ISBNs |
978-3-31-945479-5, 978-3-31-945480-1
|
Authors |
Bogdan-Andrei Tabacaru, Moomen Chaari, Wolfgang Ecker, Thomas Kruse, Cristiano Novello |
Mendeley readers
The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 5 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 2 | 40% |
Student > Bachelor | 1 | 20% |
Researcher | 1 | 20% |
Other | 1 | 20% |
Readers by discipline | Count | As % |
---|---|---|
Computer Science | 3 | 60% |
Engineering | 1 | 20% |
Unknown | 1 | 20% |