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Mendeley readers
| Chapter title |
Semiconductor Characterization Techniques
|
|---|---|
| Chapter number | 13 |
| Book title |
Fundamentals of Solid State Engineering
|
| Published by |
Springer, Boston, MA, January 2006
|
| DOI | 10.1007/0-387-28751-5_13 |
| Book ISBNs |
978-0-387-28152-0, 978-0-387-28751-5
|
Mendeley readers
The data shown below were compiled from readership statistics for 34 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Canada | 1 | 3% |
| Unknown | 33 | 97% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Master | 3 | 9% |
| Lecturer | 1 | 3% |
| Professor | 1 | 3% |
| Student > Doctoral Student | 1 | 3% |
| Researcher | 1 | 3% |
| Other | 1 | 3% |
| Unknown | 26 | 76% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 5 | 15% |
| Materials Science | 3 | 9% |
| Mathematics | 1 | 3% |
| Unknown | 25 | 74% |