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Industrial X-Ray Computed Tomography

Overview of attention for book
Attention for Chapter 8: Applications of CT for Non-destructive Testing and Materials Characterization
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Citations

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44 Mendeley
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Chapter title
Applications of CT for Non-destructive Testing and Materials Characterization
Chapter number 8
Book title
Industrial X-Ray Computed Tomography
Published by
Springer, Cham, January 2018
DOI 10.1007/978-3-319-59573-3_8
Book ISBNs
978-3-31-959571-9, 978-3-31-959573-3
Authors

Martine Wevers, Bart Nicolaï, Pieter Verboven, Rudy Swennen, Staf Roels, Els Verstrynge, Stepan Lomov, Greet Kerckhofs, Bart Van Meerbeek, Athina M. Mavridou, Lars Bergmans, Paul Lambrechts, Jeroen Soete, Steven Claes, Hannes Claes

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 44 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 44 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 10 23%
Researcher 7 16%
Student > Master 4 9%
Other 3 7%
Student > Bachelor 3 7%
Other 7 16%
Unknown 10 23%
Readers by discipline Count As %
Engineering 13 30%
Earth and Planetary Sciences 7 16%
Materials Science 3 7%
Physics and Astronomy 2 5%
Computer Science 1 2%
Other 5 11%
Unknown 13 30%