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Mendeley readers
Chapter title |
A New Sharpness Measure Based on Gaussian Lines and Edges
|
---|---|
Chapter number | 19 |
Book title |
Computer Analysis of Images and Patterns
|
Published by |
Springer, Berlin, Heidelberg, August 2003
|
DOI | 10.1007/978-3-540-45179-2_19 |
Book ISBNs |
978-3-54-040730-0, 978-3-54-045179-2
|
Authors |
Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek |
Mendeley readers
The data shown below were compiled from readership statistics for 41 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Finland | 2 | 5% |
United States | 2 | 5% |
Iran, Islamic Republic of | 1 | 2% |
Singapore | 1 | 2% |
Unknown | 35 | 85% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 13 | 32% |
Researcher | 9 | 22% |
Student > Master | 7 | 17% |
Student > Postgraduate | 3 | 7% |
Professor | 2 | 5% |
Other | 7 | 17% |
Readers by discipline | Count | As % |
---|---|---|
Computer Science | 20 | 49% |
Engineering | 14 | 34% |
Physics and Astronomy | 4 | 10% |
Social Sciences | 1 | 2% |
Unknown | 2 | 5% |