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Chapter title |
Time-Domain Measurements for Silicon Integrated Circuit Testing Using Photoconductors
|
---|---|
Chapter number | 12 |
Book title |
Picosecond Electronics and Optoelectronics
|
Published by |
Springer, Berlin, Heidelberg, January 1985
|
DOI | 10.1007/978-3-642-70780-3_12 |
Book ISBNs |
978-3-64-270782-7, 978-3-64-270780-3
|
Authors |
W. R. Eisenstadt, R. B. Hammond, D. R. Bowman, R. W. Dutton |