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Mendeley readers
Chapter title |
Focused Ion Beam Applications in the SEM Laboratory
|
---|---|
Chapter number | 30 |
Book title |
Scanning Electron Microscopy and X-Ray Microanalysis
|
Published by |
Springer, New York, NY, January 2018
|
DOI | 10.1007/978-1-4939-6676-9_30 |
Book ISBNs |
978-1-4939-6674-5, 978-1-4939-6676-9
|
Authors |
Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy |
Mendeley readers
The data shown below were compiled from readership statistics for 17 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 17 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Master | 4 | 24% |
Student > Ph. D. Student | 4 | 24% |
Researcher | 3 | 18% |
Lecturer > Senior Lecturer | 1 | 6% |
Student > Bachelor | 1 | 6% |
Other | 1 | 6% |
Unknown | 3 | 18% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 3 | 18% |
Arts and Humanities | 2 | 12% |
Chemistry | 2 | 12% |
Business, Management and Accounting | 1 | 6% |
Agricultural and Biological Sciences | 1 | 6% |
Other | 4 | 24% |
Unknown | 4 | 24% |