↓ Skip to main content
What is this page? Embed badge

Comparative Genomics

Overview of attention for book
Cover of 'Comparative Genomics'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Statistically Consistent Estimation of Rooted and Unrooted Level-1 Phylogenetic Networks from SNP Data
  3. Altmetric Badge
    Chapter 2 Galled Perfect Transfer Networks
  4. Altmetric Badge
    Chapter 3 Inferring Transcript Phylogenies from Transcript Ortholog Clusters
  5. Altmetric Badge
    Chapter 4 Gene-Adjacency-Based Phylogenetics Under a Stochastic Gain-Loss Model
  6. Altmetric Badge
    Chapter 5 REvolutionH-tl : R econstruction of  Evolution ary H istories t oo l
  7. Altmetric Badge
    Chapter 6 Gene Tree Parsimony in the Presence of Gene Duplication, Loss, and Incomplete Lineage Sorting
  8. Altmetric Badge
    Chapter 7 Assessing the Potential of Gene Tree Parsimony for Microbial Phylogenomics
  9. Altmetric Badge
    Chapter 8 Maximum Alternating Balanced Cycle Decomposition and Applications in Sorting by Intergenic Operations Problems
  10. Altmetric Badge
    Chapter 9 On the Distribution of Synteny Blocks Under a Neutral Model of Genome Dynamics
  11. Altmetric Badge
    Chapter 10 Sampling Gene Adjacencies and Geodesic Points of Random Genomes
  12. Altmetric Badge
    Chapter 11 Transcription Factors Across the  Escherichia coli Pangenome: A 3D Perspective
  13. Altmetric Badge
    Chapter 12 Revisiting the Effects of MDR1 Variants Using Computational Approaches
  14. Altmetric Badge
    Chapter 13 Evidence of Increased Adaptation of Omicron SARS-CoV-2 Codons to Humans
Attention for Chapter 3: Inferring Transcript Phylogenies from Transcript Ortholog Clusters
Altmetric Badge
Summary
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Inferring Transcript Phylogenies from Transcript Ortholog Clusters
Chapter number 3
Book title
Comparative Genomics
Published by
Springer, Cham, January 2024
DOI 10.1007/978-3-031-58072-7_3
Book ISBNs
978-3-03-158071-0, 978-3-03-158072-7
Authors

Ouedraogo, Wend Yam D. D., Ouangraoua, Aida

View on publisher site

This page is provided by Altmetric.