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Timeline
Mendeley readers
Chapter title |
Semiconductor Manufacturing Final Test Yield Prediction Using Regression with Genetic Algorithm-Based Feature Selection
|
---|---|
Chapter number | 11 |
Book title |
Intelligent Computing and Optimization
|
Published in |
Lecture Notes in Networks and Systems, January 2023
|
DOI | 10.1007/978-3-031-50151-7_11 |
Book ISBNs |
978-3-03-150150-0, 978-3-03-150151-7
|
Authors |
Dimaculangan, Ranzel V., de Luna, Robert G., Rosales, Marife A., Magsumbol, Jo-Ann V., Tubola, Orland D. |
Mendeley readers
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 1 | 33% |
Unknown | 2 | 67% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 1 | 33% |
Unknown | 2 | 67% |