↓ Skip to main content

Control Charts and Machine Learning for Anomaly Detection in Manufacturing

Overview of attention for book
Attention for Chapter 1: Introduction to Control Charts and Machine Learning for Anomaly Detection in Manufacturing
Altmetric Badge

Citations

dimensions_citation
10 Dimensions

Readers on

mendeley
23 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Introduction to Control Charts and Machine Learning for Anomaly Detection in Manufacturing
Chapter number 1
Book title
Control Charts and Machine Learning for Anomaly Detection in Manufacturing
Published by
Springer, Cham, January 2022
DOI 10.1007/978-3-030-83819-5_1
Book ISBNs
978-3-03-083818-8, 978-3-03-083819-5
Authors

Tran, Kim Phuc

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 23 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 23 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 5 22%
Student > Doctoral Student 3 13%
Researcher 3 13%
Student > Master 2 9%
Professor 1 4%
Other 1 4%
Unknown 8 35%
Readers by discipline Count As %
Computer Science 6 26%
Engineering 5 22%
Nursing and Health Professions 2 9%
Unspecified 1 4%
Physics and Astronomy 1 4%
Other 1 4%
Unknown 7 30%