You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
Image Noise Reduction Using Wide Range Tuned Mass Damper for Scanning Electron Microscope
|
---|---|
Chapter number | 38 |
Book title |
Manufacturing Systems and Technologies for the New Frontier
|
Published by |
Springer London, January 2008
|
DOI | 10.1007/978-1-84800-267-8_38 |
Book ISBNs |
978-1-84800-266-1, 978-1-84800-267-8
|
Authors |
Mitsuru Hamochi, Makoto Aoshima, Shinji Wakui |
Editors |
Mamoru Mitsuishi, Kanji Ueda, Fumihiko Kimura |