↓ Skip to main content

Nano-regime Length Scales Extracted from the First Sharp Diffraction Peak in Non-crystalline SiO2 and Related Materials: Device Applications

Overview of attention for article published in Discover Nano, January 2010
Altmetric Badge

Citations

dimensions_citation
23 Dimensions

Readers on

mendeley
22 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Title
Nano-regime Length Scales Extracted from the First Sharp Diffraction Peak in Non-crystalline SiO2 and Related Materials: Device Applications
Published in
Discover Nano, January 2010
DOI 10.1007/s11671-009-9520-6
Pubmed ID
Authors

Gerald Lucovsky, James C Phillips

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 22 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Japan 1 5%
Italy 1 5%
Unknown 20 91%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 6 27%
Researcher 3 14%
Professor > Associate Professor 2 9%
Student > Master 2 9%
Student > Bachelor 1 5%
Other 4 18%
Unknown 4 18%
Readers by discipline Count As %
Materials Science 5 23%
Physics and Astronomy 5 23%
Engineering 3 14%
Biochemistry, Genetics and Molecular Biology 1 5%
Unspecified 1 5%
Other 2 9%
Unknown 5 23%