Recent Advances in PMOS Negative Bias Temperature Instability
Springer Singapore
Chapter title |
BAT Framework Modeling of Gate First HKMG Si and SiGe Channel FDSOI MOSFETs
|
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Chapter number | 9 |
Book title |
Recent Advances in PMOS Negative Bias Temperature Instability
|
Published by |
Springer, Singapore, November 2021
|
DOI | 10.1007/978-981-16-6120-4_9 |
Book ISBNs |
978-9-81-166119-8, 978-9-81-166120-4
|
Authors |
Parihar, Narendra, Samadder, Tarun, Choudhury, Nilotpal, Huard, Vincent, Mahapatra, Souvik |
Country | Count | As % |
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Unknown | 1 | 100% |
Readers by professional status | Count | As % |
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Student > Ph. D. Student | 1 | 100% |
Readers by discipline | Count | As % |
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Engineering | 1 | 100% |