Recent Advances in PMOS Negative Bias Temperature Instability
Springer Singapore
Chapter title |
BTI Analysis Tool (BAT) Model Framework—Generation of Bulk Traps
|
---|---|
Chapter number | 6 |
Book title |
Recent Advances in PMOS Negative Bias Temperature Instability
|
Published by |
Springer, Singapore, November 2021
|
DOI | 10.1007/978-981-16-6120-4_6 |
Book ISBNs |
978-9-81-166119-8, 978-9-81-166120-4
|
Authors |
Mahapatra, Souvik, Parihar, Narendra, Samadder, Tarun, Choudhury, Nilotpal, Raj, Akshay |