You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
A Highly Reliable and Radiation-Hardened Majority PFET-Based 10T SRAM Cell
|
---|---|
Chapter number | 11 |
Book title |
Microelectronics, Circuits and Systems
|
Published by |
Springer, Singapore, August 2021
|
DOI | 10.1007/978-981-16-1570-2_11 |
Book ISBNs |
978-9-81-161569-6, 978-9-81-161570-2
|
Authors |
Aakansha, , Namith, G. S., Dinesh, A., Ram, A. Sai, Dubey, Shashank Kumar, Islam, Aminul, Aakansha |