↓ Skip to main content

Pattern Recognition. ICPR International Workshops and Challenges

Overview of attention for book
Pattern Recognition. ICPR International Workshops and Challenges
Springer International Publishing
Attention for Chapter: Towards Corner Case Detection by Modeling the Uncertainty of Instance Segmentation Networks
Altmetric Badge

Mentioned by

patent
1 patent

Citations

dimensions_citation
3 Dimensions

Readers on

mendeley
4 Mendeley