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An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array

Overview of attention for article published in Discover Nano, July 2021
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Title
An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array
Published in
Discover Nano, July 2021
DOI 10.1186/s11671-021-03569-0
Pubmed ID
Authors

Yun-Feng Kao, Jiaw-Ren Shih, Chrong Jung Lin, Ya-Chin King

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 3 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 1 33%
Unknown 2 67%
Readers by discipline Count As %
Unknown 3 100%