Pattern Recognition. ICPR International Workshops and Challenges
Springer International Publishing
Title |
Pattern Recognition. ICPR International Workshops and Challenges
|
---|---|
Published by |
Springer International Publishing, January 2021
|
DOI | 10.1007/978-3-030-68787-8 |
ISBNs |
978-3-03-068786-1, 978-3-03-068787-8
|
Editors |
Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani |
Country | Count | As % |
---|---|---|
Japan | 1 | 25% |
Unknown | 3 | 75% |
Type | Count | As % |
---|---|---|
Members of the public | 4 | 100% |
Country | Count | As % |
---|---|---|
Unknown | 7 | 100% |
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 1 | 14% |
Researcher | 1 | 14% |
Student > Master | 1 | 14% |
Unknown | 4 | 57% |
Readers by discipline | Count | As % |
---|---|---|
Computer Science | 1 | 14% |
Social Sciences | 1 | 14% |
Engineering | 1 | 14% |
Unknown | 4 | 57% |