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Pattern Recognition. ICPR International Workshops and Challenges

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Pattern Recognition. ICPR International Workshops and Challenges
Springer International Publishing
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Title
Pattern Recognition. ICPR International Workshops and Challenges
Published by
Springer International Publishing, January 2021
DOI 10.1007/978-3-030-68763-2
ISBNs
978-3-03-068762-5, 978-3-03-068763-2
Editors

Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani

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