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Timeline
Mendeley readers
Chapter title |
Utilizing NBTI for Operation Detection of Integrated Circuits
|
---|---|
Chapter number | 17 |
Book title |
VLSI Design and Test
|
Published by |
Springer, Singapore, July 2019
|
DOI | 10.1007/978-981-32-9767-8_17 |
Book ISBNs |
978-9-81-329766-1, 978-9-81-329767-8
|
Authors |
Ambika Prasad Shah, Amirhossein Moshrefi, Michael Waltl, Shah, Ambika Prasad, Moshrefi, Amirhossein, Waltl, Michael |
Mendeley readers
The data shown below were compiled from readership statistics for 6 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 6 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Professor | 2 | 33% |
Researcher | 2 | 33% |
Unknown | 2 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 2 | 33% |
Unknown | 4 | 67% |