Machine Learning in VLSI Computer-Aided Design
Springer International Publishing
Chapter title |
Machine Learning for VLSI Chip Testing and Semiconductor Manufacturing Process Monitoring and Improvement
|
---|---|
Chapter number | 8 |
Book title |
Machine Learning in VLSI Computer-Aided Design
|
Published by |
Springer, Cham, January 2019
|
DOI | 10.1007/978-3-030-04666-8_8 |
Book ISBNs |
978-3-03-004665-1, 978-3-03-004666-8
|
Authors |
Jinjun Xiong, Yada Zhu, Jingrui He |
Country | Count | As % |
---|---|---|
Unknown | 4 | 100% |
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 1 | 25% |
Other | 1 | 25% |
Student > Master | 1 | 25% |
Unknown | 1 | 25% |
Readers by discipline | Count | As % |
---|---|---|
Business, Management and Accounting | 1 | 25% |
Computer Science | 1 | 25% |
Engineering | 1 | 25% |
Unknown | 1 | 25% |