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Mendeley readers
Chapter title |
Study of Cutting-Edge AFM Modalities and SEM Techniques in Determining Surface Parameters of Si{111} Wafer
|
---|---|
Chapter number | 85 |
Book title |
The Physics of Semiconductor Devices
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Published by |
Springer, Cham, December 2017
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DOI | 10.1007/978-3-319-97604-4_85 |
Book ISBNs |
978-3-31-997603-7, 978-3-31-997604-4
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Authors |
Bokka Satya Srinivas, Veerla Swaranalatha, Avvaru Venkata Narasimha Rao, Prem Pal |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 1 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 1 | 100% |
Readers by discipline | Count | As % |
---|---|---|
Unknown | 1 | 100% |