Retraction Note: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface

Overview of attention for article published in Discover Nano, October 2013

Altmetric Badge

Mentioned by

So far, Altmetric has seen 1 X post from an account with 162 followers.

Nanoscale Research Letters "Retraction: Enhanced resistive switching memory ch..." https://t.co/X2jCu1JYN1

This page shows the most recent X posts that mention this research output.

Click here to find out how to access more activity.